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tests: cover u24le and u40le in endianess conversion tests
authorGerhard Sittig <redacted>
Sat, 22 Jan 2022 12:41:21 +0000 (13:41 +0100)
committerGerhard Sittig <redacted>
Sun, 6 Feb 2022 17:53:53 +0000 (18:53 +0100)
commit1e389eb7daa90aa5651028817ca1ffda8086f5eb
tree22281e6bb2113b9c8534286b934a530a0a8e811ftree | snapshot
parent155263435fe230b3f8d2478831d1fefd2459222acommit | diff
tests: cover u24le and u40le in endianess conversion tests

Add a tiny test case which covers the principal operation of the u24le
and u40le endianess writers. Expect to see the correct number of bytes
and the significant bits. This test does not explicitly check for the
absence of adjacent garbage which a naive writer implementation might
leave behind outside of the significant bounds.
tests/conv.c diff | blob | blame | history
Hardware access and backend lib