scpi-pps: Channel group device options for HP 663xx

[libsigrok.git] / tests / strutil.c

diff --git a/tests/strutil.c b/tests/strutil.c
index 86f25f395d06caa54b84bd332ecdf8fe75b93d9d..aded4142bf16f135afcfc08b0a32788fd2e7b7ac 100644 (file)
--- a/tests/strutil.c
+++ b/tests/strutil.c
@@ -33,11 +33,11 @@ static void test_samplerate(uint64_t samplerate, const char *expected)
        g_free(s);
 }
 
-static void test_period(uint64_t frequency, const char *expected)
+static void test_period(uint64_t v_p, uint64_t v_q, const char *expected)
 {
        char *s;
 
-       s = sr_period_string(frequency);
+       s = sr_period_string(v_p, v_q);
        fail_unless(s != NULL);
        fail_unless(!strcmp(s, expected),
                    "Invalid result for '%s': %s.", expected, s);
@@ -56,6 +56,17 @@ static void test_rational(const char *input, struct sr_rational expected)
                    input, rational.p, rational.q);
 }
 
+static void test_voltage(uint64_t v_p, uint64_t v_q, const char *expected)
+{
+       char *s;
+
+       s = sr_voltage_string(v_p, v_q);
+       fail_unless(s != NULL);
+       fail_unless(!strcmp(s, expected),
+                   "Invalid result for '%s': %s.", expected, s);
+       g_free(s);
+}
+
 /*
  * Check various inputs for sr_samplerate_string():
  *
@@ -179,33 +190,51 @@ END_TEST
 
 START_TEST(test_hz_period)
 {
-       test_period(1, "1000 ms");
-       test_period(5, "200 ms");
-       test_period(72, "13 ms");
-       test_period(388, "2 ms");
+       test_period(1, 1, "1 s");
+       test_period(1, 5, "200 ms");
+       test_period(1, 72, "13.889 ms");
+       test_period(1, 388, "2.577 ms");
+       test_period(10, 1000, "10 ms");
 
        /* Again, but now using SR_HZ(). */
-       test_period(SR_HZ(1), "1000 ms");
-       test_period(SR_HZ(5), "200 ms");
-       test_period(SR_HZ(72), "13 ms");
-       test_period(SR_HZ(388), "2 ms");
+       test_period(1, SR_HZ(1), "1 s");
+       test_period(1, SR_HZ(5), "200 ms");
+       test_period(1, SR_HZ(72), "13.889 ms");
+       test_period(1, SR_HZ(388), "2.577 ms");
+       test_period(10, SR_HZ(100), "100 ms");
 }
 END_TEST
 
 START_TEST(test_ghz_period)
 {
        /* Note: Numbers > 2^32 need a ULL suffix. */
-
-       test_period(1000000000, "1000 ps");
-       test_period(5000000000ULL, "200 ps");
-       test_period(72000000000ULL, "13 ps");
-       test_period(388000000000ULL, "2 ps");
+       test_period(1, 1000000000, "1 ns");
+       test_period(1, 5000000000ULL, "200 ps");
+       test_period(1, 72000000000ULL, "13.889 ps");
+       test_period(1, 388000000000ULL, "2.577 ps");
+       test_period(10, 1000000000000, "10 ps");
+       test_period(200, 1000000000000ULL, "200 ps");
 
        /* Again, but now using SR_GHZ(). */
-       test_period(SR_GHZ(1), "1000 ps");
-       test_period(SR_GHZ(5), "200 ps");
-       test_period(SR_GHZ(72), "13 ps");
-       test_period(SR_GHZ(388), "2 ps");
+       test_period(1, SR_GHZ(1), "1 ns");
+       test_period(1, SR_GHZ(5), "200 ps");
+       test_period(1, SR_GHZ(72), "13.889 ps");
+       test_period(1, SR_GHZ(388), "2.577 ps");
+       test_period(10, SR_GHZ(1), "10 ns");
+       test_period(200, SR_GHZ(1000), "200 ps");
+}
+END_TEST
+
+START_TEST(test_volt)
+{
+       test_voltage(34, 1, "34 V");
+       test_voltage(34, 2, "17 V");
+       test_voltage(1, 1, "1 V");
+       test_voltage(1, 5, "0.2 V");
+       test_voltage(200, 1000, "200 mV");
+       test_voltage(1, 72, "0.0138889 V");
+       test_voltage(1, 388, "0.00257732 V");
+       test_voltage(10, 1000, "10 mV");
 }
 END_TEST
 
@@ -226,6 +255,11 @@ START_TEST(test_fractional)
        test_rational("12.34", (struct sr_rational){1234, 100});
        test_rational("-12.34", (struct sr_rational){-1234, 100});
        test_rational("10.00", (struct sr_rational){1000, 100});
+       test_rational(".1", (struct sr_rational){1, 10});
+       test_rational("+0.1", (struct sr_rational){1, 10});
+       test_rational("+.1", (struct sr_rational){1, 10});
+       test_rational("-0.1", (struct sr_rational){-1, 10});
+       test_rational("-.1", (struct sr_rational){-1, 10});
 }
 END_TEST
 
@@ -241,6 +275,11 @@ START_TEST(test_exponent)
        test_rational("0.001e3", (struct sr_rational){1, 1});
        test_rational("0.001e0", (struct sr_rational){1, 1000});
        test_rational("0.001e-3", (struct sr_rational){1, 1000000});
+       test_rational("43.737E-3", (struct sr_rational){43737, 1000000});
+       test_rational("-0.1e-2", (struct sr_rational){-1, 1000});
+       test_rational("-.1e-2", (struct sr_rational){-1, 1000});
+       test_rational("-.0e-2", (struct sr_rational){0, 1000});
+       test_rational("+.0e-2", (struct sr_rational){0, 1000});
 }
 END_TEST
 
@@ -259,6 +298,7 @@ Suite *suite_strutil(void)
        tcase_add_test(tc, test_ghz);
        tcase_add_test(tc, test_hz_period);
        tcase_add_test(tc, test_ghz_period);
+       tcase_add_test(tc, test_volt);
        tcase_add_test(tc, test_integral);
        tcase_add_test(tc, test_fractional);
        tcase_add_test(tc, test_exponent);