break;
case SR_CONF_PATTERN_MODE:
stropt = g_variant_get_string(data, NULL);
- flag = 0xffff;
if (!strcmp(stropt, STR_PATTERN_NONE)) {
sr_info("Disabling test modes.");
flag = 0x0000;
} else {
return SR_ERR;
}
- if (flag != 0xffff) {
- devc->flag_reg &= ~(FLAG_INTERNAL_TEST_MODE | FLAG_EXTERNAL_TEST_MODE);
- devc->flag_reg |= flag;
- }
+ devc->flag_reg &= ~FLAG_INTERNAL_TEST_MODE;
+ devc->flag_reg &= ~FLAG_EXTERNAL_TEST_MODE;
+ devc->flag_reg |= flag;
break;
case SR_CONF_SWAP:
if (g_variant_get_boolean(data)) {
{
struct dev_context *devc;
struct sr_serial_dev_inst *serial;
- uint16_t samplecount, readcount, delaycount;
+ uint32_t samplecount, readcount, delaycount;
uint8_t ols_changrp_mask, arg[4];
int num_ols_changrp;
int ret, i;
/*
* Limit readcount to prevent reading past the end of the hardware
- * buffer.
+ * buffer. Rather read too many samples than too few.
*/
samplecount = MIN(devc->max_samples / num_ols_changrp, devc->limit_samples);
- readcount = samplecount / 4;
-
- /* Rather read too many samples than too few. */
- if (samplecount % 4 != 0)
- readcount++;
+ readcount = (samplecount + 3) / 4;
/* Basic triggers. */
if (ols_convert_trigger(sdi) != SR_OK) {