lascar-el-usb: fix potential NULL dereference and memory leak

[libsigrok.git] / tests / strutil.c

diff --git a/tests/strutil.c b/tests/strutil.c
index a36b6a2d06a1fe39a133ceb8c1a1b76df9362246..aded4142bf16f135afcfc08b0a32788fd2e7b7ac 100644 (file)
--- a/tests/strutil.c
+++ b/tests/strutil.c
@@ -56,6 +56,17 @@ static void test_rational(const char *input, struct sr_rational expected)
                    input, rational.p, rational.q);
 }
 
+static void test_voltage(uint64_t v_p, uint64_t v_q, const char *expected)
+{
+       char *s;
+
+       s = sr_voltage_string(v_p, v_q);
+       fail_unless(s != NULL);
+       fail_unless(!strcmp(s, expected),
+                   "Invalid result for '%s': %s.", expected, s);
+       g_free(s);
+}
+
 /*
  * Check various inputs for sr_samplerate_string():
  *
@@ -214,6 +225,19 @@ START_TEST(test_ghz_period)
 }
 END_TEST
 
+START_TEST(test_volt)
+{
+       test_voltage(34, 1, "34 V");
+       test_voltage(34, 2, "17 V");
+       test_voltage(1, 1, "1 V");
+       test_voltage(1, 5, "0.2 V");
+       test_voltage(200, 1000, "200 mV");
+       test_voltage(1, 72, "0.0138889 V");
+       test_voltage(1, 388, "0.00257732 V");
+       test_voltage(10, 1000, "10 mV");
+}
+END_TEST
+
 START_TEST(test_integral)
 {
        test_rational("1", (struct sr_rational){1, 1});
@@ -231,6 +255,11 @@ START_TEST(test_fractional)
        test_rational("12.34", (struct sr_rational){1234, 100});
        test_rational("-12.34", (struct sr_rational){-1234, 100});
        test_rational("10.00", (struct sr_rational){1000, 100});
+       test_rational(".1", (struct sr_rational){1, 10});
+       test_rational("+0.1", (struct sr_rational){1, 10});
+       test_rational("+.1", (struct sr_rational){1, 10});
+       test_rational("-0.1", (struct sr_rational){-1, 10});
+       test_rational("-.1", (struct sr_rational){-1, 10});
 }
 END_TEST
 
@@ -246,6 +275,11 @@ START_TEST(test_exponent)
        test_rational("0.001e3", (struct sr_rational){1, 1});
        test_rational("0.001e0", (struct sr_rational){1, 1000});
        test_rational("0.001e-3", (struct sr_rational){1, 1000000});
+       test_rational("43.737E-3", (struct sr_rational){43737, 1000000});
+       test_rational("-0.1e-2", (struct sr_rational){-1, 1000});
+       test_rational("-.1e-2", (struct sr_rational){-1, 1000});
+       test_rational("-.0e-2", (struct sr_rational){0, 1000});
+       test_rational("+.0e-2", (struct sr_rational){0, 1000});
 }
 END_TEST
 
@@ -264,6 +298,7 @@ Suite *suite_strutil(void)
        tcase_add_test(tc, test_ghz);
        tcase_add_test(tc, test_hz_period);
        tcase_add_test(tc, test_ghz_period);
+       tcase_add_test(tc, test_volt);
        tcase_add_test(tc, test_integral);
        tcase_add_test(tc, test_fractional);
        tcase_add_test(tc, test_exponent);