From: Gerhard Sittig <redacted>
Date: Sat, 22 Jan 2022 12:41:21 +0000 (+0100)
Subject: tests: cover u24le and u40le in endianess conversion tests
X-Git-Url: https://sigrok.org/gitaction?a=commitdiff_plain;h=1e389eb7daa90aa5651028817ca1ffda8086f5eb;p=libsigrok.git

tests: cover u24le and u40le in endianess conversion tests

Add a tiny test case which covers the principal operation of the u24le
and u40le endianess writers. Expect to see the correct number of bytes
and the significant bits. This test does not explicitly check for the
absence of adjacent garbage which a naive writer implementation might
leave behind outside of the significant bounds.
---

diff --git a/tests/conv.c b/tests/conv.c
index 5ef0bab1..551365e2 100644
--- a/tests/conv.c
+++ b/tests/conv.c
@@ -228,6 +228,13 @@ START_TEST(test_endian_write_inc)
 	l = p - &buff[0];
 	fail_unless(l == 4 * 48 / 8 * sizeof(uint8_t));
 	fail_unless(memcmp(&buff[0], &buff1234large[0], l) == 0);
+
+	p = &buff[0];
+	write_u24le_inc(&p, 0xfe030201);
+	write_u40le_inc(&p, 0xdcba0807060504ul);
+	l = p - &buff[0];
+	fail_unless(l == 24 / 8 + 40 / 8);
+	fail_unless(memcmp(&buff[0], &buff1234large[0], l) == 0);
 }
 END_TEST